ANALYSIS OF THE FRF’S CURVE ACCURACY OF TDOF SYSTEM USING LINEAR SWEPT-SINE EXCITATION METHOD
DOI:
https://doi.org/10.21063/jtm.2013.v3.i2.32-40Kata Kunci:
kurva FRF, eksitasi linear swept-sine, Sistem 2-DK, magnitudo FRF, frekuensi resonansi, durasi eksitasiAbstrak
Pengukuran FRF (Fungsi Respon Frekuensi) memiliki peranan yang sangat penting dalam dinamika struktur. Pengukuran ini biasanya diselenggarakan untuk memperoleh kurva FRF dari sebuah sistem yang diinvestigasi. Dari kurva FRF dapat ditentukan harga frekuensi resonansi dan rasio redaman sistem. Pada pengukuran ini, sistem umumnya dieksitasi dengan palu impak atau shaker. Pengukuran FRF dengan eksitasi shaker sering dilakukan dengan metode eksitasi linear swept-sine. Makalah ini mepaparkan suatu analisa terhadap ketelitian kurva FRF yang diperoleh dari penerapan metode ini pada sebuah Sistem 2-DK (Dua Derajat Kebebasan). Ketelitian kurva FRF ditentukan dengan mengacu kepada persentase kesalahan harga magnitudo FRF dan frekuensi resonansi Sistem 2-DK yang diperoleh terhadap harga teoritiknya. Dari analisa yang dilakukan dapat disimpulkan bahwa ketelitian kurva FRF Sistem 2-DK bergantung kepada durasi eksitasi linear swept-sine yang diterapkan. Apabila eksitasi linear swept-sine diterapkan ke Sistem 2-DK dengan durasi yang lebih lama, maka persentase kesalahan magnitudo FRF dan frekuensi resonansi Sistem 2-DK yang diperoleh lebih kecil dan mendekati harga teoritiknya.
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